Innovation Forest
Global Innovation Ecosystem
Innovation Forest
Dr. Xiaoqing Wen
Xiaoqing Wen received a Bachelor of Engineering degree from Tsinghua University, China, in 1986, followed by a Master of Engineering degree from Hiroshima University, Japan, in 1990. He then went on to complete a PhD degree at Osaka University, Japan, in 1993. From 1993 to 1997, he served as an Assistant Professor at Akita University in Japan.
He was also a Visiting Researcher at the University of Wisconsin in Madison, USA, from October 1995 to March 1996. He then joined SynTest Technologies, Inc., USA, in 1998, and
served as its Chief Technology Officer until 2003.
In 2004 he joined the Kyushu Institute of Technology, Japan, where he is currently a Professor and Director at the Dependable Integrated Systems Research Center. His research interests include VLSI testing, diagnosis, and testable designs.
Dr. Wen has co-authored and co-edited two books: VLSI Test Principles and Architectures: Design for Testability (San Francisco, CA: Morgan Kaufmann, 2006), and Power-Aware Testing and Test Strategies for Low Power Devices (New York, NY: Springer, 2009).
He also holds 33 U.S. Patents and 7 Japan Patents on VLSI testing. He received the 2008 IEICE-ISS Best Paper Award for his pioneering work on X-filling-based low-power test generation. He is a Fellow of the IEEE, a member of the IEICE, the IPSJ, and the REAJ.